Design for Yield / Design for Manufacturing 
Design for Yield / Design for Manufacturing
by Stanford
Video Lecture 14 of 27
1 rating
Views: 2,107
Date Added: August 27, 2009

Lecture Description

February 7, 2007 lecture by Fabian Klass for the Stanford University Computer Systems Colloquium (EE 380). The focus of this talk is on IC manufacturing process variability, i.e., how to design circuits for yield in the presence of manufacturing variations; also, the use of statistical methods in circuit design is presented.

Course Index

Course Description

In this course, Stanford University gives 27 video lectures on the Computer Systems Laboratory Colloquium. This course features weekly speakers on current research and developments in computer systems. Topics touch upon all aspects of computer science and engineering including logic design, computer organization and architecture, software engineering, computer applications, public policy, and the social, business, and financial implications of technology. Frequently the Colloquium provides the first public forum for discussion of new products, discoveries, or ideas. This playlist consists of seminar speakers recorded during the 2006-2007 academic year.

The original name of this course is: Computer Systems Laboratory Colloquium (2006-2007).


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